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NATSYCO
microscopy
Optical
microscopy
Electron microscopy
Scanning
probe microscope
Scanning probe microscope
•AFM (Atomic Force Microscope)
•EFM (Electrostatic force microscope)
•MFM (Magnetic force microscopy)
•SCM (Scanning capacitance microscopy)
•SGM (Scanning gate microscopy)
•STM (Scanning Tunneling microscope)
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Scanning Modes
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Constant current mode
Constant height mode
System Components
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Mechanical Parts
Electronics Parts
Computer Case
Sample preparation
Needle replacement
Needle type
Platinum-iridium (PtIr)
Tungsten tips
Gold
Needle preparation
Electrochemical etching
Mechanical shearing
System Software Execution
What SONY claims?
Is it true?
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Normal CD
Answer is yes, SONY says true
Sony Fabricated
CD

Standard Calibration sample
Obtained Imaged using NAMA-STM with very
higher resolution
Scanned by NAMA-STM
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Mean pitch=738 nm
Step high;= 100nm
Composition: solid
Nickel
Standard Calibration Sample 750HD
2 D image Standard Calibration sample
Scanned by our NAMA-STM
3 D image Standard Calibration
sample Scanned by our NAMASTM
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Gold Nano crystals 6-14nm
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ZnO Nanoparticles
around 6.5-8nm
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Gold Nano crystals 6-14nm
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Gold Nano crystals 6-14nm
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
Etching of atoms and
molecules from the surface of
gold (100x100nm) by our STM
system
(a step for Nanorobotics)
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Atomic resolution of graphite
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Thanks for Your
Attention
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